Effects of x-ray radiation on polyaniline film characteristics

Date

3-2007

Degree

Bachelor of Science in Applied Physics

College

College of Arts and Sciences (CAS)

Adviser/Committee Chair

Alvin Karlo G. Tapia

Abstract

Chemically synthesized Polyaniline was formed into thin films and was doped with sulfuric acid. It was exposed to x-rays with 40, 60, 80 and 100 kilovoltage potentials (kVp). After irradiation, electrical measurements were performed several times. Structural and morphological characterizations were also done using the Fourier Transform Infrared Spectroscopy (FTIR) and Scanning Electron Microscopy. The results showed that the conductivity of the film increased when x-ray energy is increased. There is a high possibility that the increase in the conductivity, as caused by the increase in the carrier concentration, can be attributed to the increase in the number of protonated sites. FT1R spectra further revealed that no degradation of the film happened upon x-ray exposure. The results of this study indicate that PAni film derived from chemical synthesis is sensitive to x-ray radiation and that there is a possibility of using it as a basic sensor component in the control and measurement of electromagnetic radiation.

Language

English

Location

UPLB Main Library Special Collections Section (USCS)

Call Number

Thesis

Document Type

Thesis

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