PC-based semiconductor paramteric analyzer

Date

3-2004

Degree

Bachelor of Science in Applied Physics

College

College of Arts and Sciences (CAS)

Adviser/Committee Chair

Rogel Mari D. Sese

Abstract

A PC-based system for measuring the IV curve of diode, IcVce of BJT, and IdVd of FET transistors was developed. The instrument was interfaced to the personal computer through an analog-to-digital converter and digital-to-analog converter. The ADC and DAC were calibrated with respect to the multimeter used in standard testing. The reading was found out to be linearly correlated with the multimeter reading. Software coded in Microsoft Visual Basic was used for automated data acquisition, storage and plotting. The IV curve of diodes, of BJTs, and ldVd of JFET and MOSFET was observed using the data gathered and compared it to the manually tested values. The IV curve of the five rectifier diodes tested yielded an average percent difference ranging from 0.5071% to 2.0026%. In the two zener diode devices, it was tested and yielded an average percent difference ranging from 0.5731% to 0.9135%. BJT transistors yielded an average percent difference ranging from 1.3647% to 6.3902%, JFET has an average percent difference that range 0.3830% to 3.7466% and MOSFET sample has an average percent difference ranging from 0.3781% to 0.6447%. Based on the results, the instrument yielded minimal error and is advantage way of measuring the parameters of semiconductor devices since it is automated.

Language

English

Location

UPLB Main Library Special Collections Section (USCS)

Call Number

Thesis

Document Type

Thesis

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