Measurement of deformation on fruits using Fuji apple flesh as test samples under different load and loading time

Date

5-2005

Degree

Bachelor of Science in Applied Physics

College

College of Arts and Sciences (CAS)

Adviser/Committee Chair

Nelio C. Altoveros

Abstract

A microcontroller-based instrument that measures deformation due to compression on fruits was designed, constructed, tested, and implemented. The instrument uses a Linear Variable Differential Transformer (LVDT) as sensor. The measurement of deformation was based on the measurement of displacement of the sensor. The study has three parts namely design and construction of the instrument, RS-232 communication protocol development, and calibration, testing and data gathering. The instrument was calibrated using a Vernier caliper and was tested using a Mitutoyo Dial indicator. The readings of the dial gauge and the instrument were compared. The reading of the dial gauge served as the standard value. The measurements obtained by the device were found to be within ±0.013mm of the actual displacement measured by the dial gauge and has a percentage error of 1.469%. Thus, the instrument can be used to obtain accurate measurements of deformation under different load and loading time. The instrument was implemented on measuring deformation on Fuji apple flesh samples and found that load or stress and time of application of stress significantly affect the magnitude of deformation on Fuji apple flesh samples.

Language

English

Location

UPLB Main Library Special Collections Section (USCS)

Call Number

Thesis

Document Type

Thesis

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