Programmable voltage supply for semiconductor testing and characterization
Date
3-2000
Degree
Bachelor of Science in Applied Physics
College
College of Arts and Sciences (CAS)
Adviser/Committee Chair
Emmanuel A Florido
Abstract
A microcomputer-based power supply was conceptualized, designed and fabricated. A digital - to - analog (DAC) integrated circuit was used as the programmable voltage supply and an analog - to - digital converter (ADC) as the data acquisition system. The ADC was calibrated to its full scale reading of ±4.096 V. An actual voltage calibration was done and a calibration curve fit of y = 0.922*(voltage input) - 0.294 was obtained. Two modules were fabricated, tested and analyzed. The two modules consist of the address decoder card and the DAC system. The address decoder decodes computer address 310H - 317H. The step size of the system is 0.05mv at 4.096 voltage reference. The DAC has the full scale value of ±4.096 V. Indium antimonide (InSb) and IN4002 semiconductor diode samples were characterized using the system. The forward volt -ampere characteristic of the InSb sample indicates that the material is ohmic and could be used in resistivity and Hall measurement. The forward volt-ampere data for the IN4002 semiconductor diode obtained using the system is consistent with the voltage - ampere characteristic of semiconductor diodes.
Language
English
Location
UPLB Main Library Special Collections Section (USCS)
Call Number
Thesis
Recommended Citation
Perez, Alex P. II, "Programmable voltage supply for semiconductor testing and characterization" (2000). Undergraduate Theses. 10478.
https://www.ukdr.uplb.edu.ph/etd-undergrad/10478
Document Type
Thesis