Mutation accumulation and survivability in a 32- BIT Verhulst- free penna model.
Date
4-2012
Degree
Bachelor of Science in Applied Physics
College
College of Arts and Sciences (CAS)
Adviser/Committee Chair
Chrysline Margus N Piñol
Co-adviser
Junius Andre P Balista
Abstract
Recent studies on population dynamics show that within the framework of the Penna model, stable non-zero Verhulst-free populations occur only when the mutation threshold is greater than the reproduction age (T > R). When T < R , deaths due to harmful genetic mutations are not properly compensated by births and the populations die of mutational meltdown. To delay the effects of bad mutations, a new parameter r is introduced in the simulation. At each time of reproduction, a randomly selected good gene will mutate according to the probability P = e-1/r The factor r, therefore, may be related to the effect of temperature in the alignment of spins in ferromagnetic materials. Current results demonstrate that in the T < R ease, non-zero steady states are obtained by setting r = 0.1. Population size in-creases with mutation threshold. However, the effect of T diminishes with increasing reproduction age. Steady states approach a maximum value, Nmax = (L/R )N0, where L is the bit string length and No is the initial population size. PACS: 07.05Tp [Computer modelling and simulation], 05.10.±a [Computational methods in statistical physics and nonlinear dynamics], 05.10.Ln [Monte Carlo methods], 87.15.A ± [Theory, modelling, and computer simulation]
Language
English
Location
UPLB Main Library Special Collections Section (USCS)
Call Number
Thesis
Recommended Citation
De Maligaya, Jennifer DP, "Mutation accumulation and survivability in a 32- BIT Verhulst- free penna model." (2012). Undergraduate Theses. 10450.
https://www.ukdr.uplb.edu.ph/etd-undergrad/10450
Document Type
Thesis