Test system calibration at the final test department in plant 1 of ON Semiconductor Philippines Inc. (OSPI) Carmona, Cavite
Date
7-2015
Degree
Bachelor of Science in Electrical Engineering
College
College of Engineering and Agro-Industrial Technology (CEAT)
Adviser/Committee Chair
John Paolo A. Ramoso
Restrictions
Restricted: Not available to the general public. Access is available only after consultation with author/thesis adviser and only to those bound by the confidentiality agreement.
Abstract
Companies rely and trust different test systems whichever meet their specifications, needs, and standards. The test System Calibration at the Final Test Department in Plant 1 of ON Semiconductor Philippines Inc. can be evaluated through parameters being calibrated and checked on specific load boards within the test system. This study will discuss diagnostic and calibration, likewise evaluate parameters being calibrated and checked on the Per-Pin-Digital subsystem in the Digital Resources of the ETS-364 tester, specifically the Master Clock Unit, the Quad Time Measurement unit, and the Digital Pin Unit. These include Master Clock Unit's channel clock mode and channel gate mode and its three Direct Digital Synthesis sources: Quad Time Measurement Unit's direct Digital to Analog Converters, and Digital Pin Unit's Temperature and Load sections, among other DPU sections. Test System Calibration results will be available and will be the basis for analysis in the study. Errors and limits are included in these results and tell whether parameters of a certain board passed the system calibration, through comparison of the measured errors with its corresponding limits. Percent errors to some values were also computed to emphasize discrepancies in measurements. Results will show that these PPD subsystem boards and its parameters passed the Test System Calibration and are within system specifications.
Language
English
Location
UPLB College of Engineering and Agro-Industrial Technology (CEAT)
Call Number
LG 993 2015 E64 /P48
Recommended Citation
Petingco, Mark Neslie C., "Test system calibration at the final test department in plant 1 of ON Semiconductor Philippines Inc. (OSPI) Carmona, Cavite" (2015). Undergraduate Theses. 4059.
https://www.ukdr.uplb.edu.ph/etd-undergrad/4059
Document Type
Thesis