Microthickness measurement by fizeau interferometric method
Date
4-1997
Degree
Bachelor of Science in Applied Physics
College
College of Arts and Sciences (CAS)
Adviser/Committee Chair
Demetrio A Yco, Jr.
Abstract
A more precise method of microthickness measurement, particularly thickness of thin films, was implemented using readily available materials. Upon verification of different interferometric techniques, the Fizeau interferometric method was chosen to be the most feasible and practical for implementation in our laboratory. Thickness measurements of thin films of silver deposited by evaporation were obtained by the conventional weighing method and by the implemented Fizeau interferometric method. A least uncertainty of ±10 A was obtained for the thickness measurement of one sample, while a highest uncertainty of ±50 A was obtained in another sample. This study has shown that precision microthickness measurement can be done in our laboratory
Language
English
Location
UPLB Main Library Special Collections Section (USCS)
Call Number
Thesis
Recommended Citation
Salayo, John Vincent D., "Microthickness measurement by fizeau interferometric method" (1997). Undergraduate Theses. 10505.
https://www.ukdr.uplb.edu.ph/etd-undergrad/10505
Document Type
Thesis