Microthickness measurement by fizeau interferometric method

Date

4-1997

Degree

Bachelor of Science in Applied Physics

College

College of Arts and Sciences (CAS)

Adviser/Committee Chair

Demetrio A Yco, Jr.

Abstract

A more precise method of microthickness measurement, particularly thickness of thin films, was implemented using readily available materials. Upon verification of different interferometric techniques, the Fizeau interferometric method was chosen to be the most feasible and practical for implementation in our laboratory. Thickness measurements of thin films of silver deposited by evaporation were obtained by the conventional weighing method and by the implemented Fizeau interferometric method. A least uncertainty of ±10 A was obtained for the thickness measurement of one sample, while a highest uncertainty of ±50 A was obtained in another sample. This study has shown that precision microthickness measurement can be done in our laboratory

Language

English

Location

UPLB Main Library Special Collections Section (USCS)

Call Number

Thesis

Document Type

Thesis

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